Author:
Zhang Shu-Na ,Luo Zhen-Yue ,Shen Wei-Dong ,Liu Xu ,Zhang Yue-Guang ,
Abstract
It is a radical but pressing problem to measure the group refractive index of dispersive material both accurately and rapidly in optical engineering field. In this paper, a white-light spectral interferometric system employing a fiber-optic spectrometer is developed for solving this problem. The system takes advantage of the characteristic of fiber-optic spectrometer which can get all the interferometric information by a single shot image without any mechanical scanning. Compared with the traditional windowed Fourier transform, a wavelet transform algorithm is used to directly extract the group delay rather than the phase from the interferogram. Therefore, the new method can provide a simple and fast solution, while still maintaining high accuracy. Based on this white-light Michelson interferometric system, fused silica and BK7 glass samples are measured respectively and the results agree well with the theoretical values over a broad spectral range. At the end of this paper, different mirror positions are used to verify the repeatability of our method.
Publisher
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
Subject
General Physics and Astronomy
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