Dependence of growth and property of YBa2Cu3O7-x coated conductors on the thickness of CeO2 buffer layer

Abstract

Biaxially textured MgO templates were grown on un-textured metal substrates by inclined-substrate-deposition and YBa2Cu3O7-x films were epitaxially grown on these substrates by pulsed laser deposition. Yttria-stablized-zirconia and CeO2 were deposited in turn as buffer layers prior to YBa2Cu3O7-x growth. The biaxial alignment features of the films were examined by X-ray diffraction 2θ-scan，pole-figure，-scan and rocking curve of Ω angles. The Raman spectroscopy，scanning electron microscopy and atomic force microscopy were used to characterize the orientation order，morphology and surface roughness of the YBa2Cu3O7-x films，respectively. The influence of the thickness of CeO2 on the properties of the YBa2Cu3O7-x films were investigated and the singnificant and unique dependence of the properties of YBa2Cu3O7-x films on the thickness of CeO2 were revealed. The possible mechanisms for this dependence were discussed.