Author:
Hou Hai-Hong ,Sun Xi-Lian ,Tian Guang-Lei ,Wu Shi-Gang ,Ma Xiao-Feng ,Shao Jian-Da ,Fan Zheng-Xiu ,
Abstract
The root mean square （RMS） roughness and surface scattering of Ag films，Y2O3-stabilized ZrO2 films，TiO2 films，and 1064 nm & 532 nm two-wavelength-reflection-reducing films are studied respectively by the total integrated scatter. Considering the preparation condition，growth process，material composition，and optical characteristics of the samples，the above measurement results are explained reasonably.
Publisher
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
Subject
General Physics and Astronomy
Cited by
3 articles.
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