Author:
Qin Wei,An Shu-Yue,Chen Shuai,Gong Rong-Zhou,Wang Xian, ,
Abstract
Complex permittivity is an important parameter to reflect the macroscopic electromagnetic properties of material. The selection, design, and application of related materials and devices in the electromagnetic field must be based on the electromagnetic parameters of materials in the working frequency band. The numerical iterative method is an important method to inverse and calculate the complex permittivity of material. But there always exists a difficult problem that the initial value of iteration is difficult to give accurately. Based on the relationship between the complex permittivity and the reflectivity of absorbing material, an initial value selecting method for iteration to invert permittivity of absorbing material is proposed in this work. For absorbing materials with arbitrary thickness at a certain frequency, the complex permittivity must be near the complex permittivity of perfect matching layer. Therefore, the permittivity of perfect matching layer can be used as the initial value of the iterative algorithm. On this basis, a method of calculating the complex permittivity of monolayer absorbing material by using the reflection parameter is constructed. The experimental results show that the complex permittivity of lossy material can be calculated more accurately at the frequency with absorbing performance. However a great error can be caused at the frequency where the reflectivity is close to zero. Based on the iterative solution of the complex permittivity of single-layer absorbing material, a new method of measuring the complex permittivity of material is constructed by combining multi-layer absorbing materials to enhance full-band reflectivity. Given the electromagnetic parameters of other layer materials , the permittivity of absorbing materials and low-loss materials can be obtained accurately.
Publisher
Acta Physica Sinica, Chinese Physical Society and Institute of Physics, Chinese Academy of Sciences
Subject
General Physics and Astronomy
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