Enhancing Fault Detection in Image Analysis: A Combined Wavelet-Fourier Technique for Advancing Manufacturing Quality Control
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Published:2024
Issue:2
Volume:37
Page:387-401
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ISSN:1728-144X
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Container-title:International Journal of Engineering
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language:
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Short-container-title:IJE
Author:
Khodadadi Z.,Owlia M. S.,Amiri A.
Publisher
International Digital Organization for Scientific Information (IDOSI)
Subject
General Engineering