Long term experimental verification of a single chip quantum random number generator fabricated on the InP platform

Author:

Chrysostomidis Themistoklis,Roumpos Ioannis,Alvarez Outerelo David,Troncoso-Costas Marcos,Moskalenko Valentina,Garcia-Escartin Juan Carlos,Diaz-Otero Francisco J.,Vyrsokinos Konstantinos

Abstract

AbstractThis work presents the results from the experimental evaluation of a quantum random number generator circuit over a period of 300 minutes based on a single chip fabricated on the InP platform. The circuit layout contains a gain switched laser diode (LD), followed by a balanced Mach Zehnder Interferometer for proper light power distribution to the two arms of an unbalanced MZI incorporating a 65.4 mm long spiral waveguide that translates the random phase fluctuations to power variations. The LD was gain-switched at 1.3 GHz and the chip delivered a min-entropy of 0.5875 per bit after removal of the classical noise, resulting a total aggregate bit rate of 6.11 Gbps. The recoded data set successfully passed the 15-battery test NIST statistical test suite for all data sets.

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Control and Systems Engineering

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