Microwave electrometry with bichromatic electromagnetically induced transparency in Rydberg atoms

Author:

Han Mingzhi,Hao He,Song Xiaoyun,Yin Zheng,Parniak Michal,Jia Zhengmao,Peng Yandong

Abstract

AbstractA scheme for measuring microwave (MW) electric (E) fields is proposed based on bichromatic electromagnetically induced transparency (EIT) in Rydberg atoms. A bichromatic control field drives the excited state transition, whose absorption shows three EIT windows. When a MW field drives the Rydberg transition, the EIT windows split and six transmission peaks appear. It is interesting to find that the peak-to-peak distance of transmission spectrum is sensitive to the MW field strength, which can be used to measure MW E-field. Simulation results show that the spectral resolution could be increased by about 4 times, and the minimum detectable strength of the MW E-field may be improved by about 3 times compared with the common EIT scheme. After the Doppler averaging, the minimum detectable MW E-field strength is about 5 times larger than that without Doppler effect. Also, we investigate other effects on the sensitivity of the system.

Funder

National Natural Science Foundation of China

Shandong Natural Science Foundation, China

National Key Research and Development Program of China

Taishan Scholars Program of Shandong Province, China

Shandong University of Science and Technology Research Fund, China

Innovation and entrepreneurship training program for college students of Shandong Province

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Control and Systems Engineering

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