Author:
Han Mingzhi,Hao He,Song Xiaoyun,Yin Zheng,Parniak Michal,Jia Zhengmao,Peng Yandong
Abstract
AbstractA scheme for measuring microwave (MW) electric (E) fields is proposed based on bichromatic electromagnetically induced transparency (EIT) in Rydberg atoms. A bichromatic control field drives the excited state transition, whose absorption shows three EIT windows. When a MW field drives the Rydberg transition, the EIT windows split and six transmission peaks appear. It is interesting to find that the peak-to-peak distance of transmission spectrum is sensitive to the MW field strength, which can be used to measure MW E-field. Simulation results show that the spectral resolution could be increased by about 4 times, and the minimum detectable strength of the MW E-field may be improved by about 3 times compared with the common EIT scheme. After the Doppler averaging, the minimum detectable MW E-field strength is about 5 times larger than that without Doppler effect. Also, we investigate other effects on the sensitivity of the system.
Funder
National Natural Science Foundation of China
Shandong Natural Science Foundation, China
National Key Research and Development Program of China
Taishan Scholars Program of Shandong Province, China
Shandong University of Science and Technology Research Fund, China
Innovation and entrepreneurship training program for college students of Shandong Province
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Control and Systems Engineering
Cited by
2 articles.
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