Charge exchange of O− scattering on a Si(111) surface-Reference-Cited by-同舟云学术

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Charge exchange of O− scattering on a Si(111) surface

Published:2015-09 Issue:9 Volume:69 Page:
ISSN:1434-6060
Container-title:The European Physical Journal D
language:en
Short-container-title:Eur. Phys. J. D

Author:

Wang Quanjun,Qiu Shunli,Xiong Feifei,Li Yuan,Ding Bin,Guo Yanling,Chen Ximeng,Chen Lin

Publisher

Springer Science and Business Media LLC

Subject

Atomic and Molecular Physics, and Optics

Link

http://link.springer.com/content/pdf/10.1140/epjd/e2015-60057-0.pdf

Reference30 articles.

1. L. Guillemot, V.A. Esaulov, Phys. Rev. Lett. 82, 4552 (1999)

2. B. Obreshkov, U. Thumm, Phys. Rev. A 87, 022903 (2013)

3. C. Auth, H. Winter, A.G. Borisov, B. Bahrim, D. Teillet-Billy, J.P. Gauyacq, Phys. Rev. B 57, 12579 (1998)

4. A.G. Borisov, D. Teillet-Billy, J.P. Gauyacq, Phys. Rev. Lett. 68, 2842 (1992)

5. H.D. Hagsturm, Phys. Rev. 119, 940 (1960)

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