Affiliation:
1. Federal Research Center “Computer Science and Control” of the Russian Academy of Sciences
Abstract
The article considers the problem of developing synchronous and self-timed (ST) circuits that are tolerant to faults. Redundant ST coding and two-phase discipline ensures that ST circuits are more soft error tolerant than synchronous counterparts. Duplicating ST channels instead of tripling reduces the fault-tolerant ST circuits’ redundancy and retains their reliability level compared to synchronous counterparts.
Publisher
National University of Science and Technology MISiS
Reference10 articles.
1. Viktorova V.C., Lubkov N.V., Stepanyants A.S. Reliability analysis of fault-tolerant control computing systems. Moscow: IPU RAN; 2016. 117 p. (In Russ.). https://www.ipu.ru/sites/default/files/card_file/ VLS.pdf (accessed: 08.08.2022).
2. Baikov V.D., Gerasimov Yu.M., Petrichkovich Ya.Ya., Rannev N.Yu. Increasing the fault tolerance of CMOS mixed signal IP-modules. Nanoindustry. 2021; 14(S7(107)): 368—369. (In Russ.). https://doi.org/10.22184/1993-8578.2021.14.7s.368.369
3. Hasegava M., Mori S., Ohsugi T., Kojima H., Taketani A., Kondo T., Noguchi M. Radiation damage at silicon junction by neutron irradiation. Nuclear Instruments and Methods in Physics Research. 1989; (A277): 395—400. https://doi.org/10.1016/0168-9002(89)90768-7
4. Bondar’ O.G. Designing radiation-resistant electronic devices: guidelines for practical classes. Kursk: Yugo-Zap. gos. un-t; 2018. 52 p. (In Russ.)
5. Shaven’ko N.K. Fundamentals of information theory and coding. Moscow: Izd-vo MIIGAiK; 2012. 125 p. (In Russ.). https://miigaik.ru/vtiaoai/tutorials/10.pdf