Hidden-information extraction from layered structures through terahertz imaging down to ultralow SNR

Author:

Cui Yuqing1ORCID,Xu Yafei1,Han Donghai1,Wang Xingyu1,Shen Zhonglei1,Hou Yushan1ORCID,Liang Junyan2,Wang Xianqiao3,Citrin David S.45ORCID,Zhang Liuyang1ORCID,Nandi Asoke K.16ORCID,Yan Ruqiang1,Chen Xuefeng1ORCID

Affiliation:

1. State Key Laboratory for Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an, Shaanxi 710049, People’s Republic of China.

2. School of Chemistry, Xi’an Jiaotong University, Xi’an, Shaanxi 710049, People’s Republic of China.

3. School of ECAM, University of Georgia, Athens, GA 30602, USA.

4. School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA.

5. Georgia Tech-CNRS IRL2958, Georgia Tech Lorraine, 2 Rue Marconi, 57070 Metz, France.

6. Department of Electronic and Electrical Engineering, Brunel University London, Uxbridge UB8 3PH, UK.

Abstract

Noninvasive inspection of layered structures has remained a long-standing challenge for time-resolved imaging techniques, where both resolution and contrast are compromised by prominent signal attenuation, interlayer reflections, and dispersion. Our method based on terahertz (THz) time-domain spectroscopy overcomes these limitations by offering fine resolution and a broadband spectrum to efficiently extract hidden structural and content information from layered structures. We exploit local symmetrical characteristics of reflected THz pulses to determine the location of each layer, and apply a statistical process in the spatiotemporal domain to enhance the image contrast. Its superior performance is evidenced by the extraction of alphabetic characters in 26-layer subwavelength papers as well as layer reconstruction and debonding inspection in the conservation of Terra-Cotta Warriors. Our method enables accurate structure reconstruction and high-contrast imaging of layered structures at ultralow signal-to-noise ratio, which holds great potential for internal inspection of cultural artifacts, electronic components, coatings, and composites with dozens of submillimeter layers.

Publisher

American Association for the Advancement of Science (AAAS)

Subject

Multidisciplinary

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