Visible and infrared dual-band imaging via Ge/MoS 2 van der Waals heterostructure-Reference-Cited by-同舟云学术

Visible and infrared dual-band imaging via Ge/MoS 2 van der Waals heterostructure

Published:2021-12-17 Issue:51 Volume:7 Page:
ISSN:2375-2548
Container-title:Science Advances
language:en
Short-container-title:Sci. Adv.

Author:

Hwang Aujin¹^ORCID,Park Minseong²^ORCID,Park Youngseo¹^ORCID,Shim Yeongseok¹^ORCID,Youn Sukhyeong³⁴^ORCID,Lee Chan-Ho⁵^ORCID,Jeong Han Beom⁶,Jeong Hu Young⁷^ORCID,Chang Jiwon³⁴^ORCID,Lee Kyusang²⁸,Yoo Geonwook⁵^ORCID,Heo Junseok¹^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, Ajou University, Suwon 16499, South Korea.

2. Department of Electrical and Computer Engineering, University of Virginia, Charlottesville, VA 22904, USA.

3. Department of System Semiconductor Engineering, Yonsei University, Seoul 03722, South Korea.

4. Department of Materials Science and Engineering, Yonsei University, Seoul 03722, South Korea.

5. School of Electronic Engineering, Soongsil University, Seoul 06938, South Korea.

6. Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon 34141, South Korea.

7. Graduate School of Semiconductor Materials and Devices Engineering, Ulsan National Institute of Science and Technology (UNIST), Ulsan 44919, South Korea.

8. Department of Material Science and Engineering, University of Virginia, Charlottesville, VA 22904, USA.

Abstract

Ge/MoS 2 van der Waals heterostructure enables bias-dependent selective detection of visible and near infrared.

Publisher

American Association for the Advancement of Science (AAAS)

Subject

Multidisciplinary

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