Microscopic scan-free surface profiling over extended axial ranges by point-spread-function engineering-Reference-Cited by-同舟云学术

Microscopic scan-free surface profiling over extended axial ranges by point-spread-function engineering

Author:

Gordon-Soffer Racheli¹²^ORCID,Weiss Lucien E.¹²^ORCID,Eshel Ran³,Ferdman Boris²⁴,Nehme Elias¹²⁵,Bercovici Moran¹³,Shechtman Yoav¹²⁴^ORCID

Affiliation:

1. Department of Biomedical Engineering, Technion–Israel Institute of Technology, Haifa 3200003, Israel.

2. Lorry Lokey Interdisciplinary Center for Life Sciences and Engineering, Technion–Israel Institute of Technology, Haifa 3200003, Israel.

3. Faculty of Mechanical Engineering, Technion–Israel Institute of Technology, Haifa 3200003, Israel.

4. Russell Berrie Nanotechnology Institute, Technion–Israel Institute of Technology, Haifa 3200003, Israel.

5. Department of Electrical Engineering, Technion–Israel Institute of Technology, Haifa 3200003, Israel.

Abstract

Illuminated points reveal 3D microscopic surface topography.

Funder

H2020 European Research Council

Israel Science Foundation

Zuckerman STEM Leadership Program

Technion Leaders in Science and Technology program

Israeli Innovation Authority

Publisher

American Association for the Advancement of Science (AAAS)

Subject

Multidisciplinary

Reference46 articles.

1. A. W. Adamson A. P. Gast Physical Chemistry of Surfaces (Interscience Publishers 1967).

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