STEM in situ thermal wave observations for investigating thermal diffusivity in nanoscale materials and devices-Reference-Cited by-同舟云学术

STEM in situ thermal wave observations for investigating thermal diffusivity in nanoscale materials and devices

Published:2024-01-12 Issue:2 Volume:10 Page:
ISSN:2375-2548
Container-title:Science Advances
language:en
Short-container-title:Sci. Adv.

Author:

Nguyen Hieu Duy¹^ORCID,Yamada Isamu²,Nishimura Toshiyuki³^ORCID,Pang Hong⁴^ORCID,Cho Hyunyong¹,Tang Dai-Ming⁴^ORCID,Kikkawa Jun¹^ORCID,Mitome Masanori⁵^ORCID,Golberg Dmitri⁴⁶⁷^ORCID,Kimoto Koji¹^ORCID,Mori Takao⁴⁸^ORCID,Kawamoto Naoyuki¹^ORCID

Affiliation:

1. Center for Basic Research on Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan.

2. Yamada R&D Support Enterprise, 2-8-3 Minamidai, Ishioka, Ibaraki 315-0035, Japan.

3. Research Center for Structural Materials, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan.

4. Research Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan.

5. Research Network and Facility Services Division, National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki 305-0047, Japan.

6. Centre for Materials Science, Queensland University of Technology, 2 George, Brisbane, QLD 4000, Australia.

7. School of Chemistry and Physics, Faculty of Science, Queensland University of Technology, 2 George, Brisbane, QLD 4000, Australia.

8. Graduate School of Pure and Applied Sciences, University of Tsukuba, Tennodai 1-1-1, Tsukuba 305-8671, Japan.

Abstract

Practical techniques to identify heat routes at the nanoscale are required for the thermal control of microelectronic, thermoelectric, and photonic devices. Nanoscale thermometry using various approaches has been extensively investigated, yet a reliable method has not been finalized. We developed an original technique using thermal waves induced by a pulsed convergent electron beam in a scanning transmission electron microscopy (STEM) mode at room temperature. By quantifying the relative phase delay at each irradiated position, we demonstrate the heat transport within various samples with a spatial resolution of ~10 nm and a temperature resolution of 0.01 K. Phonon-surface scatterings were quantitatively confirmed due to the suppression of thermal diffusivity. The phonon-grain boundary scatterings and ballistic phonon transport near the pulsed convergent electron beam were also visualized.

Publisher

American Association for the Advancement of Science (AAAS)

Link

https://www.science.org/doi/pdf/10.1126/sciadv.adj3825

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