Persistent antigen exposure via the eryptotic pathway drives terminal T cell dysfunction-Reference-Cited by-同舟云学术

Persistent antigen exposure via the eryptotic pathway drives terminal T cell dysfunction

Published:2021-02-12 Issue:56 Volume:6 Page:
ISSN:2470-9468
Container-title:Science Immunology
language:en
Short-container-title:Sci. Immunol.

Author:

Watkins Elyse A.¹^ORCID,Antane Jennifer T.¹^ORCID,Roberts Jaeda L.¹^ORCID,Lorentz Kristen M.²^ORCID,Zuerndorfer Sarah²^ORCID,Dunaif Anya C.¹^ORCID,Bailey Lucas J.,Tremain Andrew C.¹³,Nguyen Mindy¹^ORCID,De Loera Roberto C.¹^ORCID,Wallace Rachel P.¹^ORCID,Weathered Rachel K.¹^ORCID,Kontos Stephan²^ORCID,Hubbell Jeffrey A.¹³⁴^ORCID

Affiliation:

1. Pritzker School of Molecular Engineering, University of Chicago, Chicago, IL 60637, USA.

2. Anokion Inc., Cambridge, MA 02139, USA.

3. Committee on Immunology, University of Chicago, Chicago, IL 60637, USA.

4. Committee on Cancer Biology, University of Chicago, Chicago, IL 60637, USA.

Abstract

Targeting antigen to erythrocytes in vivo leads to a state of dysfunction and exhaustion in antigen-specific T cells.

Funder

University of Chicago

Anokion, SA

Publisher

American Association for the Advancement of Science (AAAS)