Atomic Force Microscope Studies of Fullerene Films: Highly Stable C 60 fcc (311) Free Surfaces-Reference-Cited by-同舟云学术

Atomic Force Microscope Studies of Fullerene Films: Highly Stable C 60 fcc (311) Free Surfaces

Published:1991-07-12 Issue:5016 Volume:253 Page:171-173
ISSN:0036-8075
Container-title:Science
language:en
Short-container-title:Science

Author:

Snyder Eric J.¹,Anderson Mark S.²,Tong William M.¹,Williams R. Stanley¹,Anz Samir J.¹,Alvarez Marcos M.¹,Rubin Yves³,Diederich François N.³,Whetten Robert L.¹

Affiliation:

1. Department of Chemistry and Biochemistry, and Solid State Science Center, University of California, Los Angeles, CA 90024

2. Jet Propulsion Laboratory, Pasadena, CA 91109

3. Department of Chemistry and Biochemistry, University of California, Los Angeles, CA 90024

Publisher

American Association for the Advancement of Science (AAAS)

Subject

Multidisciplinary

Reference16 articles.

1. AJIE, H, CHARACTERIZATION OF THE SOLUBLE ALL-CARBON MOLECULES C60 AND C70, JOURNAL OF PHYSICAL CHEMISTRY 94: 8630 (1990).

2. ALBRECHT, T.R., ATOMIC RESOLUTION WITH THE ATOMIC FORCE MICROSCOPE ON CONDUCTORS AND NONCONDUCTORS, JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS 6: 271 (1988).

3. Growth and Erosion of Thin Solid Films

4. EKLUND E.A. unpublished data.

5. Ordered Overlayers of C 60 on GaAs(110) Studied with Scanning Tunneling Microscopy

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