X-ray birefringence imaging-Reference-Cited by-同舟云学术

X-ray birefringence imaging

Published:2014-05-30 Issue:6187 Volume:344 Page:1013-1016
ISSN:0036-8075
Container-title:Science
language:en
Short-container-title:Science

Author:

Palmer Benjamin A.¹,Edwards-Gau Gregory R.¹,Kariuki Benson M.¹,Harris Kenneth D. M.¹,Dolbnya Igor P.²,Collins Stephen P.²

Affiliation:

1. School of Chemistry, Cardiff University, Park Place, Cardiff CF10 3AT, Wales.

2. Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, England.

Abstract

A close-up view of carbon-bromide bonds Polarizing filters are widely used in optical microscopy to highlight a range of material properties that cause optical path boundaries or birefringence in a material. Palmer et al. (see the Perspective by Lidin) developed an analog method for x-ray microscopy using linearly polarized x-ray beams and an area detector inside a synchrotron. The technique revealed the orientation of the C-Br bonds within crystalline materials. Science , this issue p. 1013 ; see also p. 969

Publisher

American Association for the Advancement of Science (AAAS)

Subject

Multidisciplinary

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