Deposition of Conformal Copper and Nickel Films from Supercritical Carbon Dioxide

Author:

Blackburn Jason M.1,Long David P.1,Cabañas Albertina1,Watkins James J.1

Affiliation:

1. Department of Chemical Engineering, University of Massachusetts, Amherst, MA 01003, USA.

Abstract

Device-quality copper and nickel films were deposited onto planar and etched silicon substrates by the reduction of soluble organometallic compounds with hydrogen in a supercritical carbon dioxide solution. Exceptional step coverage on complex surfaces and complete filling of high-aspect-ratio features of less than 100 nanometers width were achieved. Nickel was deposited at 60°C by the reduction of bis(cyclopentadienyl)nickel and copper was deposited from either copper(I) or copper(II) compounds onto the native oxide of silicon or metal nitrides with seed layers at temperatures up to 200°C and directly on each surface at temperatures above 250°C. The latter approach provides a single-step means for achieving high-aspect-ratio feature fill necessary for copper interconnect structures in future generations of integrated circuits.

Publisher

American Association for the Advancement of Science (AAAS)

Subject

Multidisciplinary

Reference12 articles.

1. Semiconductor Industry Association “1999 International Technology Roadmap for Semiconductors” (Semiconductor Industry Association San Jose CA 1999).

2. J. J. Watkins T. J. McCarthy U.S. Patent 5 789 027 (1998).

3. Chemical Fluid Deposition:  Reactive Deposition of Platinum Metal from Carbon Dioxide Solution

4. Chemical Fluid Deposition: A Hybrid Technique for Low‐Temperature Metallization

5. All Cu depositions were conducted in a dual flange cold-wall reactor in batch mode. The stainless steel reactor has a total volume of 70 ml and contains a resistively heated stage. Precursor and a single substrate were loaded into the reactor. The vessels were sealed purged and charged with CO 2 using a high-pressure syringe pump. The substrate was heated to the desired temperature (typically 200° to 250°C) and the reactor walls were maintained at a lower temperature (typically 60° to 80°C). Film deposition was initiated by the addition of excess of H 2 using a small pressurized manifold (70 ml). The quantity of H 2 admitted into the vessel was calculated using the pressure-drop measured in the manifold.

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