Breakdown of topological protection by cavity vacuum fields in the integer quantum Hall effect

Author:

Appugliese Felice1ORCID,Enkner Josefine1ORCID,Paravicini-Bagliani Gian Lorenzo1ORCID,Beck Mattias1ORCID,Reichl Christian2,Wegscheider Werner2ORCID,Scalari Giacomo1ORCID,Ciuti Cristiano3ORCID,Faist Jérôme1ORCID

Affiliation:

1. Institute of Quantum Electronics, ETH Zürich, Zürich 8093, Switzerland.

2. Laboratory for Solid State Physics, ETH Zürich, Zürich 8093, Switzerland.

3. CNRS, Laboratoire Matériaux et Phénomènes Quantiques, Université de Paris, F-75013 Paris, France.

Abstract

The prospect of controlling the electronic properties of materials via the vacuum fields of cavity electromagnetic resonators is emerging as one of the frontiers of condensed matter physics. We found that the enhancement of vacuum field fluctuations in subwavelength split-ring resonators strongly affects one of the most paradigmatic quantum protectorates, the quantum Hall electron transport in high-mobility two-dimensional electron gases. The observed breakdown of the topological protection of the integer quantum Hall effect is interpreted in terms of a long-range cavity-mediated electron hopping where the anti-resonant terms of the light-matter coupling Hamiltonian develop into a finite resistivity induced by the vacuum fluctuations. Our experimental platform can be used for any two-dimensional material and provides a route to manipulate electron phases in matter by means of vacuum-field engineering.

Publisher

American Association for the Advancement of Science (AAAS)

Subject

Multidisciplinary

Cited by 52 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3