Enhanced Method of Schottky Barrier Diodes Performance Assessment-Reference-Cited by-同舟云学术

Enhanced Method of Schottky Barrier Diodes Performance Assessment

Published:2023-03-27 Issue:2 Volume:2023 Page:181-192
ISSN:1453-8245
Container-title:Romanian Journal of Information Science and Technology
language:
Short-container-title:ROMJIST

Author:

PASCU Razvan, ,PRISTAVU Gheorghe,ONEATA Dan-Theodor, ,

Abstract

An elaborate characterization of Si Schottky diodes, fabricated with Ti and Mo contacts, is presented. Thermal treatment in forming gas is performed in order to improve the electrical performance of the fabricated samples. X-ray diffraction measurements s

Publisher

Editura Academiei Romane

Reference23 articles.

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