Investigating the Physical and Electrical Properties of La 2 O 3 Via Annealing of La(OH) 3

Abstract

Abstract A simple technique was used to fabricate pure La2O3 nanorods with a hexagonal structure using lanthanum (III) nitrate hexahydrate (La(NO3)3.6H2O) and ammonia (NH4OH). The La2O3 nanoparticles were characterized using XRD, TGA, Raman, SEM, FTIR, PL spectroscopy, and Mott-Schottky. XRD analysis showed the production of La(OH)3 nanorods under appropriate conditions, which were then successfully converted into La2O2CO3 and finally into La2O3 nanorods by annealing. TGA revealed that the total weight loss was caused by water evaporation and the dissolution of the minimal quantity of moisture present in the manufactured La2O3 NPs observed from the environment. The presence of functional groups was verified through FTIR analysis. Additionally, SEM revealed changes in morphology. PL findings displayed three emission peaks at 390, 520, and 698nm due to interband transitions and defects in the samples. Mott–Schottky analysis demonstrated that the flatband potential and acceptor density varied with annealing temperature, ranging from 1 to 1.2 V and 2 × 1018 to 1.4×1019 cm-3, respectively. Furthermore, annealing at 1000°C resulted in the lowest resistance to charge transfer (Rct).