Effect of bias conditions on transient anode current for quasi-double-sided silicon drift detector with high energy resolution

Author:

wang longjie1,Luo Wei2,Zhang Ming peng2,Jia Rui3,Li Xing2,Tian Xiao-Rang1,Wang Bolong1,Jiang Shuai1,Cheng Jia-Wang1,Ouyang Xiao-Ping4

Affiliation:

1. Chinese Academy of Sciences Institute of Microelectronics

2. CAS Institute of Microelectronics: Chinese Academy of Sciences Institute of Microelectronics

3. Institute of Microelectronics Chinese Academy of Sciences

4. Northwest Institute of Nuclear Technology

Abstract

Abstract Silicon drift detectors (SDDs) are widely applied for x-ray detection due to their remarkable energy resolution. The main contribution to energy resolution is the electrical noise of measurement system. In addition, other factors, including imperfect charge collection and ballistic deficit, can deteriorate the energy resolution. Those factors are closely related to the bias conditions of the device. However, the effect of bias conditions on device energy resolution has rarely been reported, primarily because the applied bias of classical SDDs is limited by twice the depletion voltage and little attention is focused on bias conditions. In order to enhance the flexibility of bias conditions and investigate the effect of bias conditions on energy resolution, we proposed a novel quasi-double-sided silicon drift detector (QD-SDD) with a drift ring structure designed on the back side. Device simulations of SDD and QD-SDD under different bias conditions were performed to obtain the transient current response of the anode. It was found that the QD-SDD has greater flexibility in bias conditions, and then better electron collection efficiency and shorter electron collection time can be realized at higher bias voltage (> 200 V). Finally, the fabricated QD-SDD was characterized using a 55Fe radioactive source. The experiment results showed that the energy resolution of QD-SDD varies with different bias conditions. The optimal energy resolution is 170 eV under the optimized bias conditions.

Publisher

Research Square Platform LLC

Reference17 articles.

1. Review of semiconductor drift detectors;Gatti E;Nucl. Instrum. Methods Phys. Res. A,2005

2. Semiconductor drift chamber-An application of novel Charge transport scheme;Gatti E;Nucl. Instrum. Methods Phys. Res. A,1984

3. The first 25 years of silicon drift detector: A personal view;Guazzoni C;Nucl. Instrum. Methods Phys. Res. A,2010

4. Golshani, N.: Development of Silicon Drift Detectors using Boron layer technology. PhD thesis Delft University of Technology (2015)

5. Works of art investigation with silicon drift detectors;Leutenegger P;Nucl. Instrum. Methods Phys. Res. A,2000

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3