Al8P8 double nanoring as a high-performance sensor for SF6 decomposed gases: A DFT-D4 study
Author:
Ullah Faizan1, Arfan Nur Hazimah Binti Zainal2, Ayub Khurshid1, Mahmood Tariq1, Sheikh Nadeem S.2
Affiliation:
1. COMSATS University Islamabad 2. Universiti Brunei Darussalam
Abstract
Abstract
The efficacy of an Al8P8 double nanoring as a sensor for sulfur hexafluoride (SF6) decomposition gases (H2S, HF, SO2, SO2F2, and SOF2) is investigated using density functional theory with the PBE0-D4 functional and def2-TZVP basis set. Additionally, highly accurate DLPNO-CCSD(T)/cc-pVTZ single-point energy calculations are employed to refine the interaction energies. Interaction energies ranging from − 43.31 to − 63.92 kJ mol− 1 are reported, with H2S exhibiting the strongest adsorption. SO2 adsorption induces the most significant change in the HOMO-LUMO gap, narrowing it to 1.34 eV from 3.18 eV, which suggests a substantial enhancement in electrical conductivity upon interaction. NCI analysis reveals a diverse range of interaction types, including hydrogen bonding and van der Waals interactions, contributing to the adsorption behavior. Rapid recovery times are observed, indicating the reusability of the sensor. The findings demonstrate that the Al8P8 double nanoring shows promise as a sensitive, selective, and reusable sensor, particularly for SO2, with potential applications in industrial gas leak detection and environmental safety monitoring.
Publisher
Springer Science and Business Media LLC
Reference69 articles.
1. Dervos, C.T., Vassiliou, P.: J. Air Waste Manag Assoc. 50, 137 (2000). https://doi.org/10.1080/10473289.2000.10463996 2. Tang, J., Xu, Z., Zhang, X., Sun, C.: Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, 2007, pp. 116–119. (2007) 3. Volcker, O., Koch, H., IEEE Power Engineering Society Winter Meeting:. Conference Proceedings (Cat. No.00CH37077), 2000, pp. 703–711 vol.1. (2000) 4. Jun, L., Huang, G.M., Ma, Z.: IEEE PES Gen. Meeting, p. 1–6. (2010) 5. Hama, H., Okabe, S., IEEE Transactions on Dielectrics and Electrical Insulation: 19 253. (2012). https://doi.org/10.1109/tdei.2012.6148526
|
|