Modeling Patent Quality: A System for Large-scale Patentability Analysis using Text Mining-Reference-Cited by-同舟云学术

Modeling Patent Quality: A System for Large-scale Patentability Analysis using Text Mining

Published:2012 Issue:3 Volume:20 Page:655-666
ISSN:1882-6652
Container-title:Journal of Information Processing
language:en
Short-container-title:Journal of Information Processing

Author:

Hido Shohei,Suzuki Shoko,Nishiyama Risa,Imamichi Takashi,Takahashi Rikiya,Nasukawa Tetsuya,Id^|^eacute; Tsuyoshi,Kanehira Yusuke,Yohda Rinju,Ueno Takeshi,Tajima Akira,Watanabe Toshiya

Publisher

Information Processing Society of Japan

Subject

General Computer Science

Link

https://www.jstage.jst.go.jp/article/ipsjjip/20/3/20_655/_pdf

Reference26 articles.

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2. [2] Borko, H. and Bernick, M.: Automatic Document Classification, J. ACM, Vol.10, pp.151-162 (online), DOI: http://doi.acm.org/10.1145/321160.321165 (1963).

3. [3] Bradley, A.P.: The Use of the Area Under the ROC Curve in the Evaluation of Machine Learning Algorithms, Pattern Recogn., Vol.30, No.7, pp.1145-1159 (1997).

4. [4] Economics and Statistics Division of World Intellectual Property Organization: World Intellectual Property Indicators 2010 (2010).

5. [5] Economics and Statistics Division of World Intellectual Property Organization: World Intellectual Property Indicators 2011 (2011).

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