Affiliation:
1. School of Communication and Information Engineering, Shanghai University, Shanghai, China
2. Key Laboratory of Advanced Displays and System Application, Ministry of Education, Shanghai, China
Abstract
Deep learning has achieved a great success in face recognition (FR), however, little work has been done to apply deep learning for face photo-sketch recognition. This paper proposes an adaptive scale local binary pattern extraction method for optical face features. The extracted features are classified by Gaussian process. The most authoritative optical face test set LFW is used to train the trained model. Test, the test accuracy is 98.7%. Finally, the face features extracted by this method and the face features extracted from the convolutional neural network method are adapted to sketch faces through transfer learning, and the results of the adaptation are compared and analyzed. Finally, the paper tested the open-source sketch face data set CUHK Face Sketch database(CUFS) using the multimedia experiment of the Chinese University of Hong Kong. The test result was 97.4%. The result was compared with the test results of traditional sketch face recognition methods. It was found that the method recognized High efficiency, it is worth promoting.
Publisher
National Library of Serbia
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献