The study of radiation damage of EPROM 2764 memory
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Published:2016
Issue:3
Volume:31
Page:233-239
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ISSN:1451-3994
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Container-title:Nuclear Technology and Radiation Protection
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language:en
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Short-container-title:NUCL TECH RAD PROT
Author:
Domanski Grzegorz1,
Konarzewski Bogumil1,
Kurjata Robert1,
Marzec Janusz1,
Zaremba Krzysztof1,
Dziewiecki Michal1,
Ziembicki Marcin1,
Rychter Andrzej1
Affiliation:
1. Warsaw University of Technology, Institute of Radioelectronics and Multimedia Technology, Warsaw, Poland
Abstract
A simple statistical theory of radiation damage of semiconductor memory has
been constructed. The radiation damage of EPROM memory has been investigated.
The measured number of damaged bytes is significantly lower than the expected
number resulting from the purely random distribution of the damaged bits. In
this way it has been proven that there is a correlation between the failures
of individual memory bits which are located in the same byte.
Publisher
National Library of Serbia
Subject
Safety, Risk, Reliability and Quality,Nuclear Energy and Engineering
Cited by
1 articles.
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