Author:
Gong W.,Zhang L.,Ode M.,Murakami H.,Zhou C.
Abstract
The concentration profiles of thin-film Pt/bulk Ni coatings annealed at 1150,
1250 and 1300?C for different time were measured by means of electron probe
microanalysis. The corresponding interdiffusion coefficients were then
determined using the thin-film solution. The calculated concentration
profiles based on the presently obtained interdiffusion coefficients agree
well with the experimental ones, but better at a higher temperature or a
longer time. The comparison between the presently measured concentration
profiles and the DICTRA simulated ones indicates that it is promising to
apply the well-established atomic mobility databases due to bulk diffusion
information in coating systems with some simple modifications for
diffusivities.
Publisher
National Library of Serbia
Subject
Materials Chemistry,Metals and Alloys,Mechanics of Materials,Geotechnical Engineering and Engineering Geology
Cited by
4 articles.
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