Single event transients monitoring and diagnostic in FPGA

Abstract

Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under heavy charged particles (HCP) irradiation and SET suppression methods is performed. The circuit for FPGA SET detection is designed for transients generated both inside FPGA and outside at package pin level. SET registration inside FPGA is carried out as an event when logical cell is switched. The SET control schematic circuit efficiency has been comparatively verified using heavy ion accelerator and picosecond focused laser source. SET in FPGA experimental results are presented and discussed.