A review of diode and solar cell equivalent circuit model lumped parameter extraction procedures

Abstract

This article presents an up-to-date review of several methods used for extraction of diode and solar cell model parameters. In order to facilitate the choice of the most appropriate method for the given particular application, the methods are classified according to their lumped parameter equivalent circuit model: single-exponential, double-exponential, multiple-exponential, with and without series and parallel resistances. In general, methods based on numerical integration or optimization are recommended to reduce the possible uncertainties arising from measurement noise.