Fundamental electrical noises and nondestructive testing of electronic devices-Reference-Cited by-同舟云学术

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Fundamental electrical noises and nondestructive testing of electronic devices

Published:2017-01-01 Issue:2 Volume:17 Page:31-35
ISSN:2500-3909
Container-title:Dependability
language:
Short-container-title:Nadežnostʹ

Author:

Yakubovich B. I.

Publisher

Journal Dependability

Subject

General Medicine

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Low-Frequency Noise after Temperature Treatment in Carbon-Based Thick-Film Resistor;2024 IEEE 25th International Conference of Young Professionals in Electron Devices and Materials (EDM);2024-06-28

2. Low-Frequency Noise in Light-Emitting Diodes Based on InGaN/GaN Quantum Wells under Electric Actions Accompanied with an Increase in the External Quantum Efficiency;Technical Physics;2021-01

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