Section Topography in Bragg-case Used for Kinematical Imaging of Microdefects in Si Crystals
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Published:1999-01-01
Issue:S1
Volume:38
Page:531
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ISSN:0021-4922
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Container-title:Japanese Journal of Applied Physics
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language:
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Short-container-title:Jpn. J. Appl. Phys.
Author:
Iida Satoshi,Kitamura Ryuji,Abe Takao,Kawata Hiroshi
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering