Evaluation of photo-induced shear strain in monoclinic VTe2 by ultrafast electron diffraction-Reference-Cited by-同舟云学术

Evaluation of photo-induced shear strain in monoclinic VTe2 by ultrafast electron diffraction

Published:2018-08-01 Issue:9 Volume:11 Page:092601
ISSN:1882-0778
Container-title:Applied Physics Express
language:
Short-container-title:Appl. Phys. Express

Author:

Nakamura Asuka,Shimojima Takahiro,Matsuura Masatoshi,Chiashi Yusuke,Kamitani Manabu,Sakai Hideaki,Ishiwata Shintaro,Li Han,Oshiyama Atsushi,Ishizaka Kyoko

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering

Link

http://stacks.iop.org/1882-0786/11/i=9/a=092601/pdf

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