Electronic structure of Ti1−xFexO2−δthin films with oxygen vacancies probed by soft X-ray spectroscopy-Reference-Cited by-同舟云学术

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Electronic structure of Ti1−xFexO2−δthin films with oxygen vacancies probed by soft X-ray spectroscopy

Published:2015-04-21 Issue:6S1 Volume:54 Page:06FJ07
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Usui Katsuya,Yamaguchi Shohei,Suzuki Naoya,Shimazu Yuichi,Tsuchiya Takashi,Sakai Enju,Kobayashi Masaki,Horiba Koji,Kumigashira Hiroshi,Higuchi Tohru

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/54/i=6S1/a=06FJ07/pdf

Reference36 articles.

1. A transparent metal: Nb-doped anatase TiO2

2. Ta-doped Anatase TiO2Epitaxial Film as Transparent Conducting Oxide

3. Low temperature resistivity, thermoelectricity, and power factor of Nb doped anatase TiO2

4. Electron trapping at the lattice Ti atoms adjacent to the Nb dopant in Nb-doped rutile TiO2

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Surface Electron–Ion Mixed Conduction of Ti0.99Sc0.01O2−δ Thin Film with Lattice Distortion and Oxygen Vacancies;Journal of the Physical Society of Japan;2019-05-15

2. Electrical and structural properties of TiO2−δthin film with oxygen vacancies prepared by RF magnetron sputtering using oxygen radical;Japanese Journal of Applied Physics;2016-05-06

3. Electron–Ion Mixed Conduction of BaCe0.90Y0.10O3−δ Thin Film Generated by Ru Substitution;Journal of the Physical Society of Japan;2016-03-15

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