Study about the damaged mechanism of the patterned perpendicular magnetic tunnel junctions by hydrogen ion treatments
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/54/i=4S/a=04DM07/pdf
Reference20 articles.
1. The emergence of spin electronics in data storage
2. Development of Embedded STT-MRAM for Mobile System-on-Chips
3. Proposal for an all-spin logic device with built-in memory
4. A perpendicular-anisotropy CoFeB–MgO magnetic tunnel junction
5. Giant room-temperature magnetoresistance in single-crystal Fe/MgO/Fe magnetic tunnel junctions
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1. Etching damage induced performance degradation in spin transfer torque magnetic random access memory fabrication;Journal of Vacuum Science & Technology B;2021-09
2. Ion beam etching process for high-density spintronic devices and its damage recovery by the oxygen showering post-treatment process;Japanese Journal of Applied Physics;2017-03-21
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