Activation of boron and recrystallization in Ge preamorphization implant structure of ultra shallow junctions by microwave annealing
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Reference24 articles.
1. Reduction of transient diffusion from 1–5 keV Si+ ion implantation due to surface annihilation of interstitials
2. Enhanced boron activation in silicon by high ramp-up rate solid phase epitaxial regrowth
3. Thermal evolution of extended defects in implanted Si:
4. Ab initiopseudopotential calculations of B diffusion and pairing in Si
5. Temperature and Time Dependence of Dopant Enhanced Diffusion in Self‐Ion Implanted Silicon
Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Study on dopant activation and EOT impact in HKMG stacks using microwave annealing with different frequencies;Japanese Journal of Applied Physics;2024-02-15
2. Selective Epitaxial Growth of In Situ Doped SiGe on Bulk Ge for p+/n Junction Formation;Electronics;2020-03-29
3. Semiconductor Applications;Flash Lamp Annealing;2019
4. Challenges in ultra-shallow junction technology;CMOS Past, Present and Future;2018
5. Reduction in number of crystal defects in a p+Si diffusion layer by germanium and boron cryogenic implantation combined with sub-melt laser spike annealing;Japanese Journal of Applied Physics;2017-08-22
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3