Quantitative secondary ion mass spectrometric analysis of secondary ion polarity in GaN films implanted with oxygen
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/55/i=10/a=101001/pdf
Reference21 articles.
1. Surface analysis by Secondary Ion Mass Spectrometry (SIMS)
2. Characterization of ultra thin oxynitrides: A general approach
3. Evaluation of a cesium positive ion source for secondary ion mass spectrometry
4. Quantitative analysis and depth profiling of rare gases in solids by secondary‐ion mass spectrometry: Detection of (CsR)+ molecular ions (R=rare gas)
5. A new secondary ion mass spectrometry technique for III‐V semiconductor compounds using the molecular ions CsM+
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2. The Role of Atmospheric Elements in the Wide Band-Gap Semiconductors;Acta Physica Polonica A;2019-12
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