Development of hard X-ray dark-field microscope using full-field optics-Reference-Cited by-同舟云学术

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Development of hard X-ray dark-field microscope using full-field optics

Published:2016-09-20 Issue:10 Volume:55 Page:102401
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Takano Hidekazu,Azuma Hiroaki,Shimomura Sho,Tsuji Takuya,Tsusaka Yoshiyuki,Kagoshima Yasushi

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Link

http://stacks.iop.org/1347-4065/55/i=10/a=102401/pdf

Reference15 articles.

1. Phase contrast studies of biological specimens with the x‐ray microscope at BESSY (invited)

2. High-resolution hard X-ray phase-contrast microscopy with a large-diameter and high-numerical-aperture zone plate

3. Zernike phase contrast in scanning microscopy with X-rays

4. Hard X-Ray Nano-Interferometer and Its Application to High-Spatial-Resolution Phase Tomography

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. SYNAPSE: An international roadmap to large brain imaging;Physics Reports;2023-02

2. Note: Measurement of synchrotron radiation phase-space beam properties to verify astigmatism compensation in Fresnel zone plate focusing optics;Review of Scientific Instruments;2017-08

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