Development of microscopy for lithium analysis using medium-energy ion-stimulated desorption-Reference-Cited by-同舟云学术

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Development of microscopy for lithium analysis using medium-energy ion-stimulated desorption

Published:2014-09-30 Issue:10 Volume:7 Page:106601
ISSN:1882-0778
Container-title:Applied Physics Express
language:
Short-container-title:Appl. Phys. Express

Author:

Kobayashi Takane,Kamoshida Atsushi,Akiyama Hideo,Watanabe Ken,Ohnishi Tsuyoshi,Takada Kazunori,Suzuki Taku T.

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering

Link

http://stacks.iop.org/1882-0786/7/i=10/a=106601/pdf

Reference20 articles.

1. Development of three-dimensional medium-energy ion scattering spectroscopy

2. Structure of an Er silicide film on a Si(111) substrate using three-dimensional medium-energy ion scattering

3. Development of three-dimensional medium-energy ion scattering using a large solid angle detector

4. Structural analysis of Er silicide nanowires on Si(001) using three-dimensional medium-energy ion scattering

5. Medium-energy ion scattering spectroscopy with a position-sensitive and time-resolving detector

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nanometer scale elemental analysis in the helium ion microscope using time of flight spectrometry;Ultramicroscopy;2016-03

2. Backscattering Spectrometry in the Helium Ion Microscope: Imaging Elemental Compositions on the nm Scale;Helium Ion Microscopy;2016

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