Soft-error tolerance and energy consumption evaluation of embedded computer with magnetic random access memory in practical systems using computer simulations
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/56/i=8/a=0802B6/pdf
Reference29 articles.
1. Impact of Scaling on Neutron-Induced Soft Error in SRAMs From a 250 nm to a 22 nm Design Rule
2. A power-gated MPU with 3-microsecond entry/exit delay using MTJ-based nonvolatile flip-flop
3. 10.5 A 90nm 20MHz fully nonvolatile microcontroller for standby-power-critical applications
4. Impact of ultra low power and fast write operation of advanced perpendicular MTJ on power reduction for high-performance mobile CPU
5. Testing a Commercial MRAM Under Neutron and Alpha Radiation in Dynamic Mode
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