Formation of ZnO luminescent films on SiN films for light source of high-resolution optical microscope-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Formation of ZnO luminescent films on SiN films for light source of high-resolution optical microscope

Published:2014-01-01 Issue:4S Volume:53 Page:04EH11
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Miyake Aki,Kanamori Satoshi,Nawa Yasunori,Inami Wataru,Kominami Hiroko,Kawata Yoshimasa,Nakanishi Yoichiro

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Reference43 articles.

1. Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy

2. Nonlinear structured-illumination microscopy: Wide-field fluorescence imaging with theoretically unlimited resolution

3. Imaging Intracellular Fluorescent Proteins at Nanometer Resolution

4. Sub-diffraction-limit imaging by stochastic optical reconstruction microscopy (STORM)

5. Optical stethoscopy: Image recording with resolution λ/20

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Surface morphologies, chemical compositions and luminescent properties of ZnO thin films flattened by ion milling procedure;Results in Surfaces and Interfaces;2023-05

2. UV Emission from ZnO thin Film Covered with Al Nanoparticles as Nanometric Light Source for EXA Microscope;2022 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR);2022-07-31

3. Improvement of in-plane uniformity of cathodoluminescence from ZnO luminescent layers for electron beam excitation assisted optical microscope;Japanese Journal of Applied Physics;2021-05-14

4. Electron-Beam Excitation Assisted (EXA) Optical Microscopy for High Resolution Imaging;Journal of the Japan Society for Precision Engineering;2020-07-05

5. Electroluminescence from impact excitation and carrier injection processes in a single device;Japanese Journal of Applied Physics;2019-05-13

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3