Mass Transport Between Two Metal Layers as Studied by Ion Scattering
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/13/i=S1/a=657/pdf
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Chapter 3 Structure and Characterization of Strained-Layer Superlattices;Strained-Layer Superlattices: Materials Science and Technology;1990
2. The interaction process for Ag‐Al polycrystalline thin‐film couples;Journal of Applied Physics;1979-01
3. Low-concentration oxygen depth profiling by the 16O(d, α)14N reaction;Nuclear Instruments and Methods;1978-02
4. Bibliography on Applications of Backscattering Spectrometry;Backscattering Spectrometry;1978
5. Ion Beam Studies of Thin Films and Interfacial Reactions;Ion Beam Surface Layer Analysis;1976
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