Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by
5 articles.
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1. On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography;Journal of Magnetism and Magnetic Materials;2009-04
2. Field Ion Microscopy;Comprehensive Treatise of Electrochemistry;1984
3. REFERENCES;Principles of Field Ionization and Field Desorption Mass Spectrometry;1977
4. Aiming performance of the atom probe;Review of Scientific Instruments;1975-09
5. Surface characterization by single-atom mass spectroscopy;C R C Critical Reviews in Solid State Sciences;1975-09