Author:
Yeh Ming-Yuan,Lee Ping-Yuan,Shang Jie-Ting,Lee Ying-Chieh
Abstract
Abstract
Tungsten-doped titanium dioxide (W-TiO2) thin films were successfully prepared on glass substrates by sputtering thermally oxidized W-doped titanium films in air. Tungsten-doped titanium films were deposited using a DC and RF magnetron cosputtering system. The effects of annealing treatment and W content on the W-TiO2 film microstructure were investigated. The crystalline structures, morphological features, and photocatalytic activity of the annealed W-TiO2 films were systematically studied by X-ray diffraction (XRD), field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), and ultraviolet spectrophotometry. The results indicated that annealing at 550 °C clearly induced the formation of an anatase and rutile phase mixture in the 5.5 at. % W-TiO2 films, which directly affected photocatalytic activity. The W-TiO2 films showed good photocatalytic activity under UV-light irradiation, with a higher rate of methylene blue dye degradation than in the case of undoped TiO2.
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by
2 articles.
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