Quantitative andFingerprintAnalysis Method of Nitrogen in Graphitic Carbon Materials Using Total-Electron-Yield Soft X-ray Absorption Spectroscopy-Reference-Cited by-同舟云学术

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Quantitative andFingerprintAnalysis Method of Nitrogen in Graphitic Carbon Materials Using Total-Electron-Yield Soft X-ray Absorption Spectroscopy

Published:2013-04-01 Issue:4R Volume:52 Page:041304
ISSN:0021-4922
Container-title:Japanese Journal of Applied Physics
language:
Short-container-title:Jpn. J. Appl. Phys.

Author:

Amano Taiji,Shirode Kensuke,Muramatsu Yasuji,Gullikson Eric M.

Publisher

IOP Publishing

Subject

General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering

Reference25 articles.

1. X-Ray Photoelectron Spectroscopic Observation on the Formation of Carbon Nitride Thin Films Produced by Low-Energy Nitrogen Ion Implantation

2. Nano-Indentation for Structural Analysis of Hydrogen- and Nitrogen-Containing Carbon Films

3. High-resolution electron energy-loss spectroscopy of undoped and nitrogen-doped tetrahedral amorphous carbon films

4. Synthesis of nanocrystalline nitrogen-rich carbon nitride powders at high pressure

5. Structure and nitrogen incorporation of carbon nanotubes synthesized by catalytic pyrolysis of dimethylformamide

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1. On the Nature of Organic Dust in Novae;The Astrophysical Journal;2021-08-01

2. A carbonaceous two-dimensional lattice with FeN4 units;Chemical Communications;2018

3. Strong Interaction of MnPc on Ni(111): Influence of Graphene Buffer Layer;The Journal of Physical Chemistry C;2014-12-02

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