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Externally triggerable optical pump-probe scanning tunneling microscopy

Published:2019-01-18 Issue:2 Volume:12 Page:025005
ISSN:1882-0778
Container-title:Applied Physics Express
language:
Short-container-title:Appl. Phys. Express

Author:

Mogi Hiroyuki,Wang Zi-han,Kikuchi Ryusei,Hyun Yoon Cheul,Yoshida Shoji,Takeuchi Osamu,Shigekawa Hidemi

Funder

Japan Society for the Promotion of Science

Publisher

IOP Publishing

Subject

General Physics and Astronomy,General Engineering

Link

http://iopscience.iop.org/article/10.7567/1882-0786/aaf8b2/pdf

Reference30 articles.

1. Ultrafast Spectroscopy of Semiconductors and Semiconductor Nanostructures

2. Four-Dimensional Electron Microscopy

3. Imaging the motion of electrons across semiconductor heterojunctions

4. Snapshots of cooperative atomic motions in the optical suppression of charge density waves

5. Introduction to Scanning Tunneling Microscopy

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1. Advanced Characterization of the Spatial Variation of Moiré Heterostructures and Moiré Excitons;Small;2024-09-09

2. Time-resolved force microscopy using the delay-time modulation method;Applied Physics Express;2024-01-01

3. Ultrafast Dynamics Revealed with Time-Resolved Scanning Tunneling Microscopy: A Review;ACS Applied Optical Materials;2023-03-17

4. Externally-triggerable optical pump-probe scanning tunneling microscopy with a time resolution of tens-picosecond;Scientific Reports;2023-01-25

5. Laser-combined multiprobe microscopy and its application to the materials with atomic layer thickness;Japanese Journal of Applied Physics;2022-06-23

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