Pole figure analysis from electron backscatter diffraction—an effective method of evaluating fiber-textured silicon thin films as seed layers for epitaxy
Author:
Funder
Japan Society for the Promotion of Science
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering
Link
http://iopscience.iop.org/article/10.7567/1882-0786/aafb26/pdf
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1. The Al-Si (Aluminum-Silicon) system
2. Crystal Growth of Silicon for Solar Cells
3. Aluminum-induced crystallization of amorphous silicon on glass substrates above and below the eutectic temperature
4. Elucidation of the layer exchange mechanism in the formation of polycrystalline silicon by aluminum-induced crystallization
5. Direct synthesis of highly textured Ge on flexible polyimide films by metal-induced crystallization
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1. Scalable fabrication of GaN on amorphous substrates via MOCVD on highly oriented silicon seed layers;Journal of Crystal Growth;2020-04
2. Surface-orientation control of silicon thin films via aluminum-induced crystallization on monocrystalline cubic substrates;Journal of Crystal Growth;2020-03
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