Author:
Watanabe Kuniaki,Hashiba Masao,Yamashina Toshiro
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by
14 articles.
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1. Auger-Elektronen-Mikroanalyse Grundlagen und Anwendungen;Angewandte Oberflächenanalyse mit SIMS Sekundär-Ionen-Massenspektrometrie AES Auger-Elektronen-Spektrometrie XPS Röntgen-Photoelektronen-Spektrometrie;1986
2. Quantitative Auger analysis by depth profiling of line shapes: Application to native oxide-InSb interfaces;Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures;1985-07
3. Sputter Depth Profiling of Microelectronic Structures;Journal of The Electrochemical Society;1983-05-01
4. Interpretation of apparent chemical shifts in XP spectra from oxide—GaP interfaces;Journal of Electron Spectroscopy and Related Phenomena;1983-01
5. Interface Composition Studies of Thermally Oxidized GaAs Using Auger Depth Profiling;Journal of The Electrochemical Society;1982-04-01