Curvature Dependence of Reflection Profiles of Silicon Curved Crystal Monochromators as Measured with Double-Crystal (n, -n) Setting
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Link
http://stacks.iop.org/1347-4065/17/i=S2/a=453/pdf
Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Chromatic aberration of an asymmetrically cut curved crystal due to the dynamical diffraction effect;Review of Scientific Instruments;1995-02
2. Conical geometry for sagittal focusing as applied to x rays from synchrotrons;Journal of the Optical Society of America A;1994-04-01
3. Focusing x‐ray spectrograph for laser fusion studies;Review of Scientific Instruments;1990-07
4. Ray Tracing of a Concave-Curved-Crystal Spectrometer and Its Detailed Characteristics for X-Ray Spectroscopic Diagnostics of High-Temperature Plasmas;Japanese Journal of Applied Physics;1983-06-20
5. Primary monochromators using crystal diffraction;Nuclear Instruments and Methods;1980-11
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