Author:
Aoki Masaaki,Toyabe Toru,Shinoda Takashi,Masuhara Toshiaki,Asai Shojiro,Kawamoto Hiroshi,Mitsusada Kazumichi
Publisher
The Japan Society of Applied Physics
Cited by
2 articles.
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1. Influences of circuit design on the characteristics of soft error in MOS dynamic RAMs;Electronics and Communications in Japan (Part I: Communications);1983
2. Analysis of soft error in MOS dynamic RAM;Electronics and Communications in Japan (Part I: Communications);1982