Single-Atomic-Level Probe of Transient Carrier Dynamics by Laser-Combined Scanning Tunneling Microscopy
Author:
Publisher
IOP Publishing
Subject
General Physics and Astronomy,General Engineering
Link
http://stacks.iop.org/1882-0786/6/i=3/a=032401/pdf
Reference24 articles.
1. Surface Studies by Scanning Tunneling Microscopy
2. Scanning Probe Microscopy and Spectroscopy
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4. Radio-frequency scanning tunnelling microscopy
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