Author:
Chen Wangyong,Cai Linlin,Li Yun,Wang Kunliang,Zhang Xing,Liu Xiaoyan,Du Gang
Subject
General Physics and Astronomy,Physics and Astronomy (miscellaneous),General Engineering
Cited by
2 articles.
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1. Multi-physics Simulations for Nanoscale CMOS Reliability;2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD);2023-09-27
2. Simulation Methods of Multi-physics Effects in Nano-scale CMOS;2022 International Electron Devices Meeting (IEDM);2022-12-03